Infrared Ray Emission (IREM) Based Post-Silicon Power Debug Flows Developed for Chip Power Performance

Pre-silicon power modeling, post-silicon power validation, and power debugs design efforts have significantly increased to meet speed performance, reliability deliverables and design robustness for manufacturing. IREM based power debug flow has been developed to isolate marginal circuits with excessive static and dynamic power consumption. Three root cause analysis cases are presented to demonstrate the success of this novel post-silicon debug flow