Application of scanning tunneling microscope to high-speed optical sampling measurement

A novel method of measuring high-speed electrical waveforms using a scanning tunneling microscope (STM) is demonstrated. An optical pulse train is used to turn on and off the photoconductive semiconductor switch (PCSS) on the STM probe to measure a high-speed signal in an equivalent sampling procedure. A temporal resolution of 160 ps has been achieved. This unique combination of optical sampling and STM technology is a breakthrough for measuring ultra-high-speed waveforms.<
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