High resolution spherical microwave holography

A practical technique is developed to determine the electric and/or magnetic field on objects and sources inside a spherical measurement surface. The technique, known as spherical microwave holography (SMH), provides a nondestructive, nonintrusive method of point-by-point evaluation of antennas and radomes over their spatial extent. The resolution capability of SMH is developed and demonstrated by measurements. Resolution in SMH is only limited by the measurement system's capabilities. Dielectric and metallic obstacles on the surface of a radome are located and identified. Resolution as small as 0.33/spl lambda//sub 0/ is demonstrated.<
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