A technique for dielectric measurement of cylindrical objects in a rectangular waveguide

In this paper, the inverse scattering problem of a homogeneous dielectric post in a rectangular waveguide is considered. A novel inversion algorithm, based on the method of moments and eigen analysis, for computation of the dielectric constant of the post (/spl epsiv/) from the measured voltage reflection coefficient is introduced. In this method the integral equation for the polarization current induced in the dielectric post is cast into a matrix equation, and then the contribution of /spl epsiv/ to the resulting reflection coefficient is expressed explicitly using the eigen analysis. It is shown that the dielectric constant can be obtained from the solution of a complex polynomial function which in turn can be obtained numerically using the conjugate gradient method. Practical aspects of dielectric measurement using this technique are discussed. The HP-8510 network analyzer is used to measure the reflection coefficient of dielectric posts in an X-band waveguide sample holder. Metallic and known dielectric posts are used to determine the accuracy of the dielectric measurement technique.<
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