Loading [MathJax]/extensions/MathMenu.js
Proposal of standard characterization method for dynamic circuit performance | IEEE Conference Publication | IEEE Xplore

Proposal of standard characterization method for dynamic circuit performance


Abstract:

A reliable characterization method is proposed for evaluating effective load capacitance, effective current drivability and effective leak current in dynamic operation. I...Show More

Abstract:

A reliable characterization method is proposed for evaluating effective load capacitance, effective current drivability and effective leak current in dynamic operation. In this method, two test structures are utilized in order to make the evaluation reliable; one is an open-loop inverter array for extracting parameters, and the other is a conventional closed-loop ring oscillator for confirmation. The method is easily extended for general high-speed circuits such as emitter-coupled logic (ECL) and compound-semiconductor circuits. CMOS circuits are used in this study.<>
Date of Conference: 22-25 March 1993
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-0857-3
Conference Location: Sitges, Spain

Contact IEEE to Subscribe

References

References is not available for this document.