V(z) equation for tilted planar specimens in acoustic microscopy

A V(z) equation for tilted planar specimens has been derived by an angular-spectrum approach. Numerical calculations of V(z) have been carried out for both spherical and cylindrical lenses. Results show that new techniques for material characterization are possible. In particular, tilting specimens by suitable angles permits directional investigations with spherical lenses. The proposed theory can be applied to any system, in all cases where specimens are tilted with respect to an axis of the measurement apparatus.<
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