Design for manufacturability: a two-step analytic modeling approach

A yield optimization technique that uses macromodels of the circuit performance to strongly reduce the computational effort is presented. Global macromodels were accurately obtained by means of experimental design and linear regression methods. The technique was then used to obtain an analytic representation of the yield as a function of the designable parameters by modeling the results of multiple Monte Carlo analyses. An example of the application of the proposed approach to a CMOS operational amplifier is included.<
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