SEETEST: a system dedicated to the characterisation of memory sensitivity to SEE

With new technologies, high integration levels of space components, Single Event Effects are becoming of major concern for spacecraft reliability. MEMTEST and SELTEST are respectively upset and latch-up characterization system developed at DERTS. Irradiation tests have been performed, on SRAM and EEPROM devices, by means of conventional Californium sources and heavy ion accelerator (IPN Van de Graaff machine ORSAY). The results are discussed. Test validity problems and the influence of experimental parameters are examined.<
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