Reliability test of interconnections using electrical noise measurement

The excess electrical noise in aluminum and aluminum alloy thin films were measured. The magnitude and frequency exponent for noise spectra of 1/f/sup alpha / were measured as a function of the sample temperature and current density. Two different regions in plots of normalized 1/f/sup alpha / noise magnitude, with alpha between 1.2 and 2.2. versus inverse temperature were observed. The time dependence experiment on excess noise of aluminum showed 1/f/sup alpha /, with alpha larger than 2.2, noise spectra during later stages of the electromigration process.<
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