Characterization of anisotropic substrate materials for microwave applications

The authors deal with the characterization of uniaxially anisotropic substrates. The determination of permittivity tensors of anisotropic substrates for integrated circuits was performed on the basis of the measured phase constant of a single microstrip line at several frequencies by using an optimization routine and spectral-domain analysis. The investigations have shown that the dispersion characteristics of microstrip lines on isotropic and anisotropic substrate materials, respectively, differ in a manner which allows determination of the permittivity tensor of the substrate material.<
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