Maintenance processor/time stress measurement device (MP/TSMD) use for failure trend analysis

The authors define the use of advanced built-in-test-equipment technology to reduce or eliminate reliability and maintainability problems associated with on-equipment fault detection and isolation. System supportability requirements for both mature and new systems defined the need for a subsystem level device to perform built-in-test (BIT) functions in addition to capturing environmental stress data. To satisfy these requirements, a microprocessor-based maintenance processor/time stress measurement device (MP/TSMD) system was developed and field-tested. During 1992, the MP/TSMD will be operationally used to identify failure trends in the B-1B offensive radar system and to provide data for environmental stress simulation at the depot. The authors provide a technical description of the MP/TSMD and the fault logging system designed around it.<
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