Optimal spare allocation for defect-tolerant VLSI

The authors study the problem of allocating spares to specific fault-tolerant VLSI/WSI (wafer scale integration) designs to maximize the global yield. Four problems are examined: (1) the optimal yield problem for k-out-of-n systems; (2) the optimal partition of elements; (3) spare allocation for trees; and (4) spare allocations for row/column reconfiguration systems.<
>