MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits

Shrinking devices to nanoscale, increasing integration densities, and reducing voltage levels to the thermal limit-all conspire to produce faulty systems. A possible solution is a fault-tolerant probabilistic framework based on Markov random fields. This article introduces a new redundancy element, the MRF reinforcer, which achieves significant immunity to single-event upsets and noise