Design and Application of Self-Testing Comparators Implemented with MOS PLA's

A high probability of detecting errors caused by hardware faults is an essential property of any fault-tolerant system. VLSI technology makes the use of duplication and matching for error detection practical and attractive. A critical circuit in this context is a self-testing comparator. Faults in the comparator must be detected so that they do not mask discrepancies between the duplicated modules.