Characterization of TFT/LCD arrays

Thin-film-transistor (TFT) array characterization is important to liquid-crystal display (LCD) design, development, failure analysis, and sorting on a manufacturing line. The authors present characterization highlights obtained using a TFT array tester that can detect, accurately locate, and in many cases identify both line faults and pixel faults in a TFT array. It can provide useful performance information on normally operating pixels.<
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