Microwave introscopy using multifrequency measurements & transversal scan

Description of a microwave introscope combining multifrequency measurements and transversal scanning is presented. Longitudinal distance dependencies of reflectivity are obtained by synthesis from multifrequency data. The multifrequency measurements and synthesis is done in real-time. The apparatus carries out the measurements in free space. It is assembled using measuring modules of scalar reflectometer of series P2 (R2). Combination of data in longitudinal and transversal directions produces radio images of dielectric structures with embedded objects. A horn antenna as a probe is used. Some results of transversal resolution as function of distance and estimation of domain for correct determination of parameters structure are presented.