A test bench for full characterization of the DIALOG chip

We present a semi-automatic test system designed for the complete characterization of the DIALOG integrated circuit. The DTS (DIALOG test system) checks all the circuit functionalities. It measures the DIALOG output channels programmable time delay and width with 72 ps time resolution. DIALOG threshold voltage outputs are measured with a resolution of 0.6 mV. The complete characterization of one chip takes about 2 minutes.