Compression mode diagnosis enables high volume monitoring diagnosis flow

Diagnosis of scan test fail data plays a crucial role in enhancing ramp up of new CMOS technology generations. To enable faster feedback it is preferable to establish a monitoring diagnosis methodology on the production test floor. This paper reports result of a study on using test time optimized compressed scan technology and associated new algorithms for fault diagnosis. Data is based on a system-on-a-chip (SoC) product that is manufactured using Infineon Technologies' 130 nm process. A comparison with uncompressed scan test and diagnosis shows feasibility of implementing a monitoring diagnosis flow with compressed scan test serving the high throughput test flow.