Measurement of loss tangent of dielectric and semiconductor materials at millimeter waves and temperatures 0.9-300 K

Technique for measurement of low loss dielectric and semiconductor materials at frequencies 30-140 GHz and temperatures T=0.6-300 K is presented. Features of the experimental low temperature complex are described. Whispering gallery disk dielectric resonator (WGDDR) method is applied to measure loss tangent for several promising technology materials. Temperature dependences of loss tangents are obtained for materials under test and presented in report.