The influence of polarization on hole transport in plasma-polymerized organosilicon films

The influence of polarization procedure on charge carrier transport in plasma polymerized organosilicon films was investigated. Mobility of holes was determined using the time-of-flight method. It was found that frozen-in polarization of the plasma polymerized hexamethyldisilazane films increases the value of drift mobility. This process is fully reversible and after depolarization the value of drift mobility returns to the one before polarization.<
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