Electrical analysis of a domino logic cell with GOS faults

Gate-oxide shorts (GOS) have an increasing impact on the integrated circuit production yield due to the reduction of the related dimensions. The detection of GOS is a challenging issue in the field of testing. This paper presents a detailed study of the impact of a GOS fault affecting a domino logic circuit. Indeed, domino logic specific clocked operating principle induces a different behavior from standard full CMOS cells under the effect of a GOS, which can enable GOS detection. Finally, some clues to enhance GOS detection in domino cells are proposed.