A configurable integrated test methodology for monolithic microwave integrated circuit production

A configurable integrated test (CIT) model has been developed for GaAs monolithic microwave integrated circuit (MMIC) production control. The optimal process/test strategy for an MMIC in production phase can easily by predicted from this model. The adaptive nature of the CIT model also suggests suitability of the screen criteria and quantifies the necessity of each test step. Application of this CIT method of MMIC manufacturing will result in significant cost reductions. The CIT theory and application examples are presented.<
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