Radiation qualification of electronics components used for the ATLAS level-1 muon endcap trigger system

The ATLAS level-1 muon endcap trigger system is divided into three parts; one off-detector part and two on-detector parts. Application specific ICs (ASICs) and anti-fuse Field Programmable Gate Array (FPGAs) are actively used in the on-detector parts. A Low-Voltage Data Signaling (LVDS) serial link is used for the data transfer between the two on-detector parts (15 m apart) and G-Link (Hewlett-Packard 1.4 Gbaud high speed data link) with optical transmission (90 m) is used from one of the on-detector parts to the off-detector part. These components will be exposed to a radiation of approximately 200 Gy (including safety factors) for ten years corresponding to a total ionizing dose (TID) and a hadron fluence of 2/spl times/10/sup 10/ hadrons/cm/sup 2/. We have investigated systematically the radiation susceptibility to both the total ionizing dose and the single event effects for ASIC, FPGA, and Commercial Off The Shelf (COTS) serializer and deserializer chipsets for two types of LVDS serial link and one G-Link type. In this documentation we report the result of the irradiation tests for these devices and discuss their validity in the ATLAS system.