Thin-film electroluminescent devices: Influence of Mn-doping method and degradation phenomena

Comparative experiments on ac thin-film electroluminescent (ACTFEL) emitters show the influence of the electroluminescent source material preparation on the L(V) characteristic. The influence on the polycrystalline structure has been investigated by Scanning Transmission Electron Microscopy (STEM). Different types of degradation occurring during sustained operation of the devices are reported and solutions proposed.