Poisoning of orientation ratio on NiP-coated substrates

The surface chemical evolution of NiP-coated AlMag disk substrate was analyzed using contact angle, X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy techniques. Its effect on magnetic film structure and orientation ratio was also studied. It was also shown that slow nickel carbonate surface growth under ambient condition poisoned the orientation ratio of the structure.