Multiport scattering parameter measuring system

A multiport scattering parameter measuring system for the full characterization of N-port devices is presented. It is based on a conventional two-port network analyser and an additional external switch matrix test set. The system is capable of full error correction including the one of imperfect terminations. Due to its switch matrix layout the system achieves a very high dynamic range. It is easily applicable to devices with a very high number of ports and can easily be calibrated. The system presented here is most suitable for convenient high accuracy characterization of multiport devices in R&D environments due to the use of mechanical switches but can also be adapted to industrial environments. The performance of the system and the validity of the novel scattering parameter transformation are demonstrated on measurements of directional couplers.