A new technique for permittivity and permeability measurements at millimeter waves

A new technique is proposed to determine the permittivity and permeability of planar samples at millimeter wavelengths. The values of /spl epsiv/ and /spl mu/ are determined from the measurement of power reflected from the system planar specimen + metallic reflector for various positions of the reflector. The technique is realized using the precise quasioptical reflectometer.