New trends for multiharmonic source-pull and load-pull measurements

An original measurement method for nonlinear device "Source-Pull" characterization is proposed. It allows faster device characterization compared to conventional techniques. The whole chart representations are extrapolated from few measurements by computation. The new method has been validated on a test bench. This paper explains the method and shows the validation process. We also show the impact of the topologies of Multiharmonic Source-Pull and Load-Pull benches.