Screening the reliable semiconductor chips by laser acceleration of deep level recombination. Process certification for industrial application

A new technological process, devoted to screen the reliable semiconductor chips before the assembly processes, was developed. The acceleration of minority carriers generation-recombination at deep level centers by laser irradiation of semiconductor chips is used. An 84% efficiency of the screening method was evaluated. In order to allow the industrial utilization of the process, a method to prove and certificate the screening performances is proposed. An important increasing of production efficiency is obtained because of the high weight of packaging costs.