Measurement and analysis for stripline material parameters using network analyzers

The characterization of material parameters for dielectrics used in the construction of stripline and related structures is presented. The measured scattering parameters of transmission-line samples are used to predict the characteristics of the dielectric materials used in the construction in addition to effects due to rough dielectric-conductor interfaces. The measurements have been performed using a network analyzer with the 'thru-reflect-line' calibration technique. The calibration process, the structure of the transmission-line sample, and the frequency-domain model are reviewed. Measured results are presented with predicted values for the dielectric constant and loss tangent of dielectric materials common in thick-film structures.<
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