Thermoelectric figure of merit of M-sulphides (M=Fe, Co, Ni, Pd) thin films

We have grown transition metal (Fe, Co, Ni, Pd) sulphide thin films and we have measured the electrical and transport properties during the formation of the films. Film structure was identified by XRD measurements. The thermoelectric power factor (S/sup 2//spl sigma/) was determined and compared with that of known thermoelectric materials. We have also performed preliminary measurements on these thin films in order to determine the thermoelectric figure of merit (ZT). ZT values of FeS/sub 2/ thin films were estimated at different temperatures and compared with those of natural single crystals. Their values were found to be low, but it is expected to get higher ZT values by controlling the film deposition parameters and doping them.