Microstructural examination of the influence of Si substrate orientation on the morphology of CdTe/ZnTe films

In this paper, we study about the microstructural characterization of CdTe/ZnTe thin films grown on Si substrates having (311), (211), and (111) orientations using transmission electron microscopy (TEM). TEM images of a ZnTe buffer layer grown on a (111) Si substrate that has twinning across the (111) plane. The twinned and untwinned regions have identical crystal structures, but the twinned region is misoriented across the twinning plane with respect to the parent crystal.