A double-sampling extended-counting ADC

Extended-counting analog-to-digital conversion combines the accuracy of /spl Sigma//spl Delta/ modulation with the speed of algorithmic conversion. In this paper, a double-sampling technique is introduced for this type of converter. It is based on a variant of the fully floating bilinear integrator. This way, the clock frequency of the converter is almost halved. An experimental converter was designed in a 0.6-/spl mu/m CMOS technology for a bandwidth of 500 kHz at a 3.3-V supply. In the switched-capacitor implementation, the hardware is extensively reused. This way, the converter can be realized with only one operational amplifier. On the other hand, compared to alternative implementations, the amount of switches is increased. These are designed carefully in order not to degrade the performance. The converter converts a sample in 24 clock cycles and achieves a dynamic range of 87 dB. The peak signal-to-noise ratio (SNR) and signal-to-noise-plus-distortion ratio (SNDR) were measured to be 82 and 81 dB, respectively. The power consumption was 28-mW analog and 20-mW digital. The converter core occupies 0.7 mm/sup 2/ including digital logic.