Scaled model measurement of the embedding impedance of a 660-GHz waveguide SIS mixer with a 3-standard deembedding method

In this paper, the embedding impedance of a 660-GHz superconductor-insulator-superconductor (SIS) mixer is investigated using a 100-times scaled-model with a new 3-standard deembedding technique. The mixer embedding impedance is extracted from the reflection coefficients measured at the waveguide port of the mixer for three different terminations at the SIS junction's feed point. The three standards chosen are open-circuit, short-circuit and resistive load. Measured results are compared with those simulated by a high-frequency structure simulator (HFSS).