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Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration | IEEE Conference Publication | IEEE Xplore

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Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration


First Page of the Article

Date of Conference: 16-16 March 2000
Date Added to IEEE Xplore: 15 April 2003
Print ISBN:0-7803-6275-7
Conference Location: Monterey, CA, USA

First Page of the Article


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