Abstract:
A novel methodology of physical and electrical design rule based statistical process monitoring and modeling (PEDR-SPMM) was proposed. By the aid of principal component a...Show MoreMetadata
Abstract:
A novel methodology of physical and electrical design rule based statistical process monitoring and modeling (PEDR-SPMM) was proposed. By the aid of principal component analysis, the correlated physical and electrical parameters are decomposed into an independent variable set. The key parameters of multiple products mixed-run could be formulated by the independent variable set, which reduce the modeling complexity, and also provide a way to get a comparison between different technology nodes.
Published in: Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.
Date of Conference: 11-11 April 2002
Date Added to IEEE Xplore: 08 April 2003
Print ISBN:0-7803-7464-9