Application of the Eyring Model to Capacitor Aging Data

The Eyring Model has been used to derive the "power rule" for capacitors. Analytical models for evaluating progressive and step stress tests are presented. Various methods are discussed for determining the value of the exponent for the power rule. In particular, the relation between the exponent of the power rule and the \beta of the Weibull distribution, for both progressive and constant stress tests, is discussed. Data for mica capacitors are used to demonstrate the validity of these relations and to illustrate methods for determining the constants of the equations.