A Hierarchical Framework for Classifying Analog Single-Event Transients by Shape

Hierarchical clustering for classifying and sorting Analog Single-Event Transients (ASETs) based on similarities in waveform shape is demonstrated. Rather than solely relying on measures such as pulse height and width, the approach organizes ASETs into structured families based on shape that are correlated to sensitive regions within the device, facilitating the identification of underlying circuit response mechanisms. Dynamic Time Warping (DTW) is used to develop a distance metric within the hierarchy to align and compare transient shapes. Using pulsed-laser experiments conducted at the U.S. Naval Research Laboratory (NRL), spatial maps of ASETs in the LM124 operational amplifier are generated and clustered to reveal regions of vulnerability and distinct charge collection behaviors. The method is further validated using heavy-ion data from the Lawrence Berkeley National Laboratory’s (LBNL) 88" Cyclotron, demonstrating its robustness across different radiation sources.