Impact of Elastic Layer on the Electromechanical Performance of Composite Piezoelectric Semiconductor Shells

In this paper, a two-dimensional model of a composite piezoelectric semiconductor (PS) shell was established based on the principle of virtual work, the principle of charge conservation, and the first-order shear deformation theory to investigate its electromechanical characteristics. The Differential Quadrature Method (DQM) was employed to numerically analyze the composite PS shell subjected to a tensile load. The results revealed the presence of potential wells and barriers within the structure when the elastic constants of the covering layer were varied. It was found that smoother variations in material parameters led to a reduction in the magnitude of potential barriers and wells. Additionally, adjusting the thickness of the elastic covering layer on both sides can also tune the electric potential distribution within the device, providing valuable insights for the design of PS thin-film transistor devices.