Extraction of the Equivalent Coupling Surface of a capacitor mounted on a PCB using Near-Field Scan

This paper presents an approach to extract the equivalent coupling surface of a capacitor mounted on a PCB. This is the first step of developing a methodology to extract the insertion loss of an EMI filter in situ. The approach utilizes near-field scan technique based on H-field probe coupled to a capacitor on a PCB. The value of mutual inductance between the probe and capacitor is then extracted by post processing. Finally, the equivalent coupling surface is extracted by optimization using GEMSEO tools.