Content-Based Compressive Sensing for AFM Nanorobot

Atomic Force Microscopy (AFM) is a crucial technique in the field of nanotechnology. However, the scanning efficiency of AFM is a key factor that restricts its applications. In this paper, a content-based compressed sensing method for AFM is proposed to improve the scanning efficiency by fewer sampling points. The measurement matrix is designed using the prior knowledge of the sample. The original image is constructed based on the orthogonal matching pursuit algorithm. Experiments on the AFM are conducted to verify the effectiveness of the proposed approach.