Survey of Depth-Parameter Selection in Heavy-Ion Upset-Rate Calculations

Heavy-Ion, single event upset rates are typically calculated using a rectangular parallelepiped model. These models require the user to make an engineering judgement regarding the depth of the sensitive volume. This paper surveys the current usage and guidance for the depth parameter, then goes on to discuss the consequences for depth parameter selection in the prediction of on-orbit rates. Traditional guidance for the depth parameter can lead to rate underestimates for modern devices and overestimates for device level effects.