Reliability Modeling Analysis and Uncertainty Quantification Method for Electronic Systems With Multireliability Dependency

The reliability of complex electronic systems is paramount due to their widespread application and critical functions. The existence of uncertainty and dependency increases the difficulty of reliability analysis. Current research cannot effectively solve this problem. This article proposes a reliability modeling analysis and uncertainty quantification method for electronic systems with multireliability dependency. The structure-related reliability, the overload-related reliability, and the performance reliability are utilized to evaluate the multidimensional capacities of an electronic system. The degradation-aware model and arithmetic Liu process are employed for uncertainty model construction of the structure-related reliability, while the uncertain random renewal reward process is utilized for uncertainty modeling of the overload-related reliability. Performance reliability is influenced by them, and it is modeled with margin-based reliable principle. The dependencies among the three reliabilities are categorized as O-S (overload-structure) dependency, S-O (structure-overload) dependency, and S/O-P (structure/overload-performance) dependency to analyze the effect of the multireliability dependency on the reliability analysis result. Accordingly, the comprehensive reliability analysis algorithm is developed. Finally, the proposed method is implemented to the numerical case of the microcontroller unit as a specific illustration, demonstrating its effectiveness and rationality.