Comparison of PID degradation in different PV Technologies in Climatic Chamber Tests

Photovoltaic (PV) modules of different technologies – Mono PERC & TOPCon, with backsheet & glass back cover, have been tested for 3 cycles (288 Hours) in PID test. The module failure rates are the highest for the Backsheet-based Mono PERC modules, and the lowest for the TOPCon dual glass modules. The median power degradation for the TOPCon dual glass modules is one-third of the Mono PERC Backsheet-based modules. For Mono PERC modules, Fill Factor (FF) degradation is the highest contributing factor for power degradation, but in case of TOPCOn modules, Open Circuit Voltage (Voc) degradation is the highest contributing factor.