Transient Analysis of Simplified Composite Structure Waveguide Limiter With Plasma-Energy Selective Surface Based on SETD Method

To avoid damage to electronic equipment by high-power microwave (HPM), a simplified composite structure waveguide limiter model with plasma-energy selective surface (ESS) is proposed. In this way, the power leakage problem, which may occur when the single-stage plasma limiter is used to protect against the HPM effect, can be effectively avoided. This limiter system model can be controlled and described by the electromagnetic (EM) fields, plasma physics, and p-i-n equivalent circuit model. This model comprehensively considers the dynamic characteristics of the plasma portion and the multifield coupling mechanism. The spectral-element time-domain (SETD) method is used for system integration and self-consistent simulation analysis. The numerical results show that the limiting performance of the composite structure waveguide limiter is much better than that of the single-stage plasma limiter under the action of HPM pulses. Meanwhile, this composite structure protection scheme not only solves the problem that the waveguide plasma limiter cannot protect against lower power, but also solves the problem of insufficient isolation when the waveguide plasma limiter protects against high power, so as to effectively protect the subsequent circuit. This research provides theoretical guidance for the use of waveguide limiter devices to protect against HPM damage.