High-Speed Up-Conversion-Based Mid-Infrared Line-Scanner at Room Temperature

Line-scanners are used in the industry to perform in-line spectroscopy for non-destructive testing and quality control in the visible to short-wave-infrared regime. The mid-infrared range is receiving increasing attention, however conventional technologies in MIR sensing are typically limited in speed, resolution, sensitivity and require cryogenic cooling. Up-conversion-based systems offer an alternative by translation of the wavelengths from MIR to NIR. Thus permitting the use of silicon based detectors [1], [2].