Towards Model-Driven Circuit Test Development: SysMLv2-Based Test Modeling and Assisted Workflow

The final test of produced Integrated Circuits (ICs) is one of the most time-consuming stages of the circuit production lifecycle. It consists of the specification-based test development and the actual test execution to identify manufacturing defects. As the development depends heavily on the used Automatic Test Equipment (ATE) for executing the tests, it needs to be repeated if the test system or its software version changes. Therefore, this paper presents an approach for Model-Driven Circuit Test Development and its integration in existing processes. A SysMLv2 profile is introduced to model essential elements for the setup and execution of production tests for manufactured devices. Model-Based Systems Engineering (MBSE) is widely used for the development of complex systems, but has not been applied within circuit testing yet. An instantiation, either manually by the user or automatically from design sources or verification results, enables the generation of test programs in the target language of the used test system and its software platform. The combined approach reduces development effort and supports consistent, reusable test modeling across multiple abstraction levels.