Mechanism Mixed Data Driven Electric Strength Prediction of Large Area Metalized Films

This paper focuses on mechanism-data combined driven electric strength prediction of large area metalized films. Breakdown failures are decoupled into low electric field, medium electric field and high electric field breakdown modes based on breakdown mechanism and causes. The mixed three parameters Weibull distribution model is introduced for analysis of various mechanism and causes. Subsequently, the area effect prediction for large area films breakdown strength is developed, considering the breakdown causes and action laws as area increasing. The accuracy of the prediction method is verified by the breakdown experiments of metalized films at different temperatures. The results show that the breakdown strength is negatively correlated with the area and temperature. Furthermore, a low electric field distribution dominance effect is observed, indicating that the action laws of mechanisms change differently with increasing area. The deviation between the predicted value and the experimental fitting value is no more than 2.5%.