Comparison of Heavy Ion and Pulsed Laser Response for Various Commercial-off-the-Shelf Components

Space electronics face two categories of radiation risk: Total dose exposure that results in gradual degradation of the part over time and Single Event Effects which, as is given by the name, are effects that can result from a single particle event. Pulsed laser systems have been used as a substitute for accelerator systems for single event effects testing. In this work the single event effects of four different devices under both heavy ion and pulsed laser are compared. The intent is to show that pulsed laser techniques can be used to induce the same sort of effects seen under heavy ion irradiation.