IEEE Approved Draft Standard for Analog Defect Modeling and Coverage

This standard defines a defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs). The portion of a defect universe, comprising thousands or millions of reasonably likely defects, that is detected or “covered” by tests of analog and mixed-signal circuits depends on many factors, which this standard considers, such as detectability, process variations, defect characteristics, and redundancy. The contents of a defect coverage summary are specified, and dozens of commonly used terms are clearly defined, to aid communication about the quality of tested ICs